Description
Fitur
- Layar TFT 5,7 inci, VGA berwarna dan konektor probe LEMO/BNC.
- Rentang pengukuran yang luas dari 1-10000 mm.
- Linearitas horizontal dan vertikal yang tepat dan stabil dengan linearitas horizontal 0,1% dan linearitas vertikal 2%.
- Kurva DAC, AVG, DGS, dan gema cacat membantu mengevaluasi penghitungan ekuivalen cacat.
- Tampilan simultan bentuk gelombang A-scan dan B-scan resolusi tinggi.
- Empat cara untuk menampilkan bentuk gelombang: setengah gelombang positif, setengah gelombang negatif, gelombang penuh, dan frekuensi radio.
- Penyesuaian penguatan otomatis, perhitungan ekuivalen cacat, dan fungsi memori puncak.
- Dua pengaturan gerbang individual dan fungsi alarm.
- Pengukuran gerbang meliputi amplitudo gema, jalur sinar, kedalaman, proyeksi, dan sebagainya.
- Pembekuan bentuk gelombang tersedia: secara penuh, puncak, komparatif, dan amplop.
- Tersedia 50 saluran pendeteksian dengan parameter pendeteksian terpisah dan kurva DAC (Koreksi Amplitudo Jarak) di setiap saluran.
- Generator pulsa gelombang persegi berkinerja tinggi yang dapat disesuaikan
- Tiga mode pendeteksian (probe tunggal, probe kristal ganda, dan transmisi) dengan fungsi kalibrasi otomatis.
- Terhubung ke PC melalui antarmuka USB dengan perangkat lunak canggih untuk analisis dan manajemen data.
- Memori super besar, 1000 bentuk gelombang dan diagram bentuk gelombang dinamis 4X2000 frame dapat disimpan, dengan fungsi penyimpanan, pemeriksaan dan peninjauan saluran, bentuk gelombang, catatan dinamis.
- Laporan deteksi cacat dapat dicetak.
| Standard Delivery | |
| Main unit | 1 |
| Lithium battery | 2 |
| Power adaptor (3A/9V) | 1 |
| LEMO-Q9 Probe connecting cable | 1 |
| LEMO-Q6 Probe connecting cable | 1 |
| Straight beam probe (φ20 2.5MHz ) | 1 |
| Angle beam probe (φ20 2.5MHz ) | 1 |
| Coupling agent | 1 |
| Necklace belt | 1 |
| Wrist belt | 1 |
| Time Certificate | 1 |
| Warranty card | 1 |
| Instruction manual | 1 |
Spesifikasi
|
Operating temperature |
-10℃~+50℃ |
|
Storage temperature |
-20℃~+60℃ |
|
Language |
English/Chinese/Spanish selectable |
|
Probe socket |
LEMO or BNC |
|
Battery (mAh) |
2×3.7V 5000mAh |
|
Battery working time |
>8h |
|
Charging time (h) |
<8h |
|
Power adapter Input |
100-240~50/60Hz |
|
Output |
9V DC/3A~4A |
|
LCD |
Color transmission TFT, 640×480 |
|
Dimension (mm) |
177X255X51 |
|
Weight (g) |
1200 |
| Basic |
Receiver |
||
| Measuring unit |
mm/inch/μs |
Gain (dB) |
0~110 |
| Scanning range (mm) |
0-10000 |
Bandwidth (MHz) |
0.5~15 |
| Sound velocity (m/s) |
600-16000 |
Rectify |
Positive half wave, negative half wave, full and RF |
| P-delay (μs) |
-1.000~750.000 |
Vertical linearity accuracy |
±2% |
| D-delay (μs) |
-20~+3400 |
Amplifier resolution (dB) |
±1 |
| Test mode |
Pulse-echo, dual and through transmission |
Rejection (1%) |
Linear, 0~80% of the full screen |
| Scanning mode |
A scan and B scan, displaying both simultaneously |
Sampling frequency (MHz) |
80 |
| Pulse generator |
Crosstalk rejection (dB) |
≥80 |
|
| Pulser (V) |
Square pulse |
Dead zone (μs) |
≤10 (related with transmitting) |
| Transmitting voltage |
100~400(V) variable in steps of 10V |
Dynamic range (dB) |
≥40 |
| Transmitting pulse width (ns) |
75/100~500 variable in steps of 50ns |
Instant resolution (dB) |
≥32 |
| Damping (Ω) |
50/100/200/500 |
Time base linearity |
<±0.2% full screen |
| Pulse repetition frequency (Hz) |
10~1000 |
Sensitivity leavings (dB) |
≥62 |
|
Measurements and others |
Data management, communication and print |
||
|
Gate |
2 indepent gates |
Data storage |
50 channels |
|
Testing position |
Edge, Peak value |
1000 wave images (including 980 A scan images and 20 B scan images) |
|
|
Gate measurements |
Echo amplitude, Sound path, depth, projection etc. |
4×2000 dynamic wave image |
|
|
Freeze |
Freeze waveform, peak value, comparative and envelope |
Store, review or replay the channels, waves |
|
|
AVG equivalent calculate |
Calculate the flaw equivalent according to the flaw echo and AVG curve |
All the data can be stored to PC or flash disk |
|
|
DAC flaw evaluating |
Make flaw evaluation according to flaw echo and DAC curve |
Communication |
Communicate with PC via USB interface |
|
Gate logic |
Off, measurement, gate positive wave alarm, gate negative wave alarm |
Printing |
Print report |
|
Gate alarm |
off, anytime, hold for 0.2s, 0.5s, 1s and 2s, lock |
Outout port |
|
|
Alarm |
on/off |
USB OTG port |
USB 2.0 device connected with PC |
Contact Us:
– Telp & WhatsApp 0812-1248-2471
– Email alfin@testindo.com
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