Alat Ukur Ketebalan Lapisan Coating Thickness Gauge Probes

Panduan Probe Opsional dan Spesifikasi untuk Pengukur Ketebalan Lapisan

Description

Panduan Probe Opsional dan Spesifikasi untuk Pengukur Ketebalan Lapisan

Probe model

F400

F1

F1/90º

F10

N1

CN02

Operating principle

Magnetic induction

Eddy current

Measuring range (μm)

0-400

0-1250

 0-10000

0 to 1250 μm
0 to 40μm
(for chrome plate
on copper)

10~200

Low range resolution (μm)

0.1

0.1

10

0.1

1

Accuracy

One-point calibration (μm)

±(3%H+1)

±(3%H+10)

±(3%H+1.5)

±(3%H+1)

Two-point calibration (μm)

±[(1~3)H%+0.7]

±[(1~3)H%+1]

±[(1~3)%H+10]

±[(1~3)%H+1.5]

Measuring conditions

Min curvature of the
min area (mm)

Convex 1

1.5

Flatten

10

3

Flatten

Diameter of the min
area (mm)

φ3

φ7

φ7

φ40

φ5

φ7

Critical thickness
of substrate (mm)

0.2

0.5

0.5

2

0.3

unlimited

 

Tabel Referensi untuk pemilihan Probe

 

Contact Us:
– Telp & WhatsApp 0812-1248-2471
– Email alfin@testindo.com

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