Description
Panduan Probe Opsional dan Spesifikasi untuk Pengukur Ketebalan Lapisan
Probe model |
F400 |
F1 |
F1/90º |
F10 |
N1 |
CN02 |
|
Operating principle |
Magnetic induction |
Eddy current |
|||||
Measuring range (μm) |
|
0-400 |
0-1250 |
0-10000 |
0 to 1250 μm |
10~200 |
|
Low range resolution (μm) |
|
0.1 |
0.1 |
10 |
0.1 |
1 |
|
Accuracy |
One-point calibration (μm) |
±(3%H+1) |
±(3%H+10) |
±(3%H+1.5) |
±(3%H+1) |
||
Two-point calibration (μm) |
±[(1~3)H%+0.7] |
±[(1~3)H%+1] |
±[(1~3)%H+10] |
±[(1~3)%H+1.5] |
– |
||
Measuring conditions |
Min curvature of the |
Convex 1 |
1.5 |
Flatten |
10 |
3 |
Flatten |
Diameter of the min |
φ3 |
φ7 |
φ7 |
φ40 |
φ5 |
φ7 |
|
Critical thickness |
0.2 |
0.5 |
0.5 |
2 |
0.3 |
unlimited |
Tabel Referensi untuk pemilihan Probe
Contact Us:
– Telp & WhatsApp 0812-1248-2471
– Email alfin@testindo.com
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